BibTeX record conf/irps/SlottkeKHTKMD15

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@inproceedings{DBLP:conf/irps/SlottkeKHTKMD15,
  author       = {D. Slottke and
                  R. J. Kamaladasa and
                  M. Harmes and
                  Ilan Tsameret and
                  Mauro J. Kobrinsky and
                  Timothy McMullen and
                  John Dunklee},
  title        = {Wafer-level electromigration for reliability monitoring: Quick-turn
                  electromigration stress with correlation to package-level stress},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112806},
  doi          = {10.1109/IRPS.2015.7112806},
  timestamp    = {Thu, 31 Aug 2023 19:50:53 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SlottkeKHTKMD15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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