BibTeX record conf/irps/SharmaPZLCYRKSYCH23

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@inproceedings{DBLP:conf/irps/SharmaPZLCYRKSYCH23,
  author       = {Manisha Sharma and
                  Hokyung Park and
                  Yinghong Zhao and
                  Ki{-}Don Lee and
                  Liangshan Chen and
                  Joonah Yoon and
                  Rakesh Ranjan and
                  Caleb Dongkyan Kwon and
                  Hyewon Shim and
                  Myungsoo Yeo and
                  Shin{-}Young Chung and
                  Jon Haefner},
  title        = {Polarity Dependency of {MOL-TDDB} in FinFET},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117774},
  doi          = {10.1109/IRPS48203.2023.10117774},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SharmaPZLCYRKSYCH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}