BibTeX record conf/irps/SatoSJLBKRLHJLKLLPSJSKK23

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@inproceedings{DBLP:conf/irps/SatoSJLBKRLHJLKLLPSJSKK23,
  author       = {Hideo Sato and
                  H. M. Shin and
                  H. Jung and
                  S. W. Lee and
                  H. Bae and
                  H. Kwon and
                  K. H. Ryu and
                  W. C. Lim and
                  Y. S. Han and
                  J. H. Jeong and
                  J. M. Lee and
                  D. S. Kim and
                  K. Lee and
                  J. H. Lee and
                  J. H. Park and
                  Y. J. Song and
                  Y. Ji and
                  B. I. Seo and
                  J. W. Kim and
                  H. H. Kim},
  title        = {Comprehensive study on prediction of endurance properties from breakdown
                  voltage in high-reliable {STT-MRAM}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118152},
  doi          = {10.1109/IRPS48203.2023.10118152},
  timestamp    = {Fri, 20 Oct 2023 17:04:43 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SatoSJLBKRLHJLKLLPSJSKK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}