BibTeX record conf/irps/SampathMC20

download as .bib file

@inproceedings{DBLP:conf/irps/SampathMC20,
  author       = {Madankumar Sampath and
                  Dallas T. Morisette and
                  James A. Cooper},
  title        = {Constant-Gate-Charge Scaling for Increased Short-Circuit Withstand
                  Time in SiC Power Devices},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128220},
  doi          = {10.1109/IRPS45951.2020.9128220},
  timestamp    = {Mon, 03 Jan 2022 22:37:46 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/SampathMC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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