BibTeX record conf/irps/Rodriguez-Davila20

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@inproceedings{DBLP:conf/irps/Rodriguez-Davila20,
  author       = {Rodolfo A. Rodriguez{-}Davila and
                  Richard A. Chapman and
                  Massimo Catalano and
                  Manuel Quevedo{-}Lopez and
                  Chadwin D. Young},
  title        = {Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors
                  by Excess of Oxygen in Atomic Layer Deposited Al2O3},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129345},
  doi          = {10.1109/IRPS45951.2020.9129345},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/Rodriguez-Davila20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}