BibTeX record conf/irps/RahmanDNLR18

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@inproceedings{DBLP:conf/irps/RahmanDNLR18,
  author       = {Anisur Rahman and
                  Javier Dacu{\~{n}}a and
                  Pinakpani Nayak and
                  Gerald S. Leatherman and
                  Stephen Ramey},
  title        = {Reliability studies of a 10nm high-performance and low-power {CMOS}
                  technology featuring 3rd generation FinFET and 5th generation {HK/MG}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353648},
  doi          = {10.1109/IRPS.2018.8353648},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/RahmanDNLR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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