BibTeX record conf/irps/PutchaBFWZPZAKW20

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@inproceedings{DBLP:conf/irps/PutchaBFWZPZAKW20,
  author       = {Vamsi Putcha and
                  Erik Bury and
                  Jacopo Franco and
                  Amey Walke and
                  Simeng Zhao and
                  Uthayasankaran Peralagu and
                  Ming Zhao and
                  AliReza Alian and
                  Ben Kaczer and
                  Niamh Waldron and
                  Dimitri Linten and
                  Bertrand Parvais and
                  Nadine Collaert},
  title        = {Exploring the {DC} reliability metrics for scaled GaN-on-Si devices
                  targeted for {RF/5G} applications},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129251},
  doi          = {10.1109/IRPS45951.2020.9129251},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PutchaBFWZPZAKW20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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