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BibTeX record conf/irps/PuschkarskyGAGR18
@inproceedings{DBLP:conf/irps/PuschkarskyGAGR18, author = {Katja Puschkarsky and Tibor Grasser and Thomas Aichinger and Wolfgang Gustin and Hans Reisinger}, title = {Understanding and modeling transient threshold voltage instabilities in SiC MOSFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {3}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353560}, doi = {10.1109/IRPS.2018.8353560}, timestamp = {Sat, 19 Oct 2019 20:31:23 +0200}, biburl = {https://dblp.org/rec/conf/irps/PuschkarskyGAGR18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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