BibTeX record conf/irps/PieperXBPB23

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@inproceedings{DBLP:conf/irps/PieperXBPB23,
  author       = {Nicholas J. Pieper and
                  Yoni Xiong and
                  Dennis R. Ball and
                  J. Pasternak and
                  Bharat L. Bhuva},
  title        = {Effects of Collected Charge and Drain Area on {SE} Response of SRAMs
                  at the 5-nm FinFET Node},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118115},
  doi          = {10.1109/IRPS48203.2023.10118115},
  timestamp    = {Tue, 19 Sep 2023 11:58:25 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PieperXBPB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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