BibTeX record conf/irps/PedreiraMDSRCRF19

• > Home > conf/irps/PedreiraMDSRCRF19

@inproceedings{DBLP:conf/irps/PedreiraMDSRCRF19,
  author       = {G. Pedreira and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Javier Diaz{-}Fortuny and
                  Pablo Saraza{-}Canflanca and
                  Rosana Rodr{\'{\i}}guez and
                  Rafael Castro{-}L{\'{o}}pez and
                  Elisenda Roca and
                  Francisco V. Fern{\'{a}}ndez and
                  Montserrat Nafr{\'{\i}}a},
  title        = {A New Time Efficient Methodology for the Massive Characterization
                  of {RTN} in {CMOS} Devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720582},
  doi          = {10.1109/IRPS.2019.8720582},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PedreiraMDSRCRF19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}