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BibTeX record conf/irps/PedreiraLZRVSCC22
@inproceedings{DBLP:conf/irps/PedreiraLZRVSCC22, author = {O. Varela Pedreira and Melina Lofrano and Houman Zahedmanesh and Philippe J. Roussel and Marleen H. van der Veen and Veerle Simons and Emmanuel Chery and Ivan Ciofi and Kris Croes}, title = {Assessment of critical Co electromigration parameters}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas, TX, USA, March 27-31, 2022}, pages = {8}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/IRPS48227.2022.9764427}, doi = {10.1109/IRPS48227.2022.9764427}, timestamp = {Mon, 01 May 2023 13:01:28 +0200}, biburl = {https://dblp.org/rec/conf/irps/PedreiraLZRVSCC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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