BibTeX record conf/irps/PedreiraLZRVSCC22

download as .bib file

@inproceedings{DBLP:conf/irps/PedreiraLZRVSCC22,
  author       = {O. Varela Pedreira and
                  Melina Lofrano and
                  Houman Zahedmanesh and
                  Philippe J. Roussel and
                  Marleen H. van der Veen and
                  Veerle Simons and
                  Emmanuel Chery and
                  Ivan Ciofi and
                  Kris Croes},
  title        = {Assessment of critical Co electromigration parameters},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {8},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764427},
  doi          = {10.1109/IRPS48227.2022.9764427},
  timestamp    = {Mon, 01 May 2023 13:01:28 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PedreiraLZRVSCC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.