BibTeX record conf/irps/PatraRKC0C18

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@inproceedings{DBLP:conf/irps/PatraRKC0C18,
  author       = {Devyani Patra and
                  Ahmed Kamal Reza and
                  Mehdi Katoozi and
                  Ethan H. Cannon and
                  Kaushik Roy and
                  Yu Cao},
  title        = {Accelerated {BTI} degradation under stochastic {TDDB} effect},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353616},
  doi          = {10.1109/IRPS.2018.8353616},
  timestamp    = {Thu, 15 Apr 2021 16:06:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PatraRKC0C18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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