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BibTeX record conf/irps/PatraRKC0C18
@inproceedings{DBLP:conf/irps/PatraRKC0C18, author = {Devyani Patra and Ahmed Kamal Reza and Mehdi Katoozi and Ethan H. Cannon and Kaushik Roy and Yu Cao}, title = {Accelerated {BTI} degradation under stochastic {TDDB} effect}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {5}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353616}, doi = {10.1109/IRPS.2018.8353616}, timestamp = {Thu, 15 Apr 2021 16:06:39 +0200}, biburl = {https://dblp.org/rec/conf/irps/PatraRKC0C18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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