BibTeX record conf/irps/ParkKKKR18

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@inproceedings{DBLP:conf/irps/ParkKKKR18,
  author       = {Gyusung Park and
                  Minsu Kim and
                  Chris H. Kim and
                  Bongjin Kim and
                  Vijay Reddy},
  title        = {All-digital {PLL} frequency and phase noise degradation measurements
                  using simple on-chip monitoring circuits},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353613},
  doi          = {10.1109/IRPS.2018.8353613},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ParkKKKR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}