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BibTeX record conf/irps/PariharSSWSM19
@inproceedings{DBLP:conf/irps/PariharSSWSM19, author = {Narendra Parihar and Uma Sharma and Richard G. Southwick and Miaomiao Wang and James H. Stathis and Souvik Mahapatra}, title = {On the Frequency Dependence of Bulk Trap Generation During {AC} Stress in Si and SiGe {RMG} P-FinFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey, CA, USA, March 31 - April 4, 2019}, pages = {1--8}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/IRPS.2019.8720577}, doi = {10.1109/IRPS.2019.8720577}, timestamp = {Wed, 28 Jun 2023 16:23:50 +0200}, biburl = {https://dblp.org/rec/conf/irps/PariharSSWSM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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