BibTeX record conf/irps/PapandreouPPIPT19

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@inproceedings{DBLP:conf/irps/PapandreouPPIPT19,
  author       = {Nikolaos Papandreou and
                  Haralampos Pozidis and
                  Thomas P. Parnell and
                  Nikolas Ioannou and
                  Roman A. Pletka and
                  Sasa Tomic and
                  Patrick Breen and
                  Gary A. Tressler and
                  Aaron Fry and
                  Timothy Fisher},
  title        = {Characterization and Analysis of Bit Errors in 3D {TLC} {NAND} Flash
                  Memory},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720454},
  doi          = {10.1109/IRPS.2019.8720454},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PapandreouPPIPT19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}