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BibTeX record conf/irps/PaliwodaCKSM18
@inproceedings{DBLP:conf/irps/PaliwodaCKSM18, author = {Peter C. Paliwoda and Zakariae Chbili and A. Kerber and D. Singh and Durga Misra}, title = {Ambient temperature and layout impact on self-heating characterization in FinFET devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353640}, doi = {10.1109/IRPS.2018.8353640}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/PaliwodaCKSM18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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