BibTeX record conf/irps/PadovaniPKBSVBL19

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@inproceedings{DBLP:conf/irps/PadovaniPKBSVBL19,
  author       = {Andrea Padovani and
                  Milan Pesic and
                  Mondol Anik Kumar and
                  Pieter Blomme and
                  Alexandre Subirats and
                  Senthil Vadakupudhupalayam and
                  Zunaid Baten and
                  Luca Larcher},
  title        = {Understanding and Variability of Lateral Charge Migration in 3D {CT-NAND}
                  Flash with and Without Band-Gap Engineered Barriers},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720566},
  doi          = {10.1109/IRPS.2019.8720566},
  timestamp    = {Sun, 25 Oct 2020 23:11:44 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/PadovaniPKBSVBL19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}