BibTeX record conf/irps/OmiyaKSKSNSNSN15

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@inproceedings{DBLP:conf/irps/OmiyaKSKSNSNSN15,
  author       = {Masaki Omiya and
                  Shoji Kamiya and
                  Nobuyuki Shishido and
                  Kozo Koiwa and
                  Hisashi Sato and
                  Masahiro Nishida and
                  Takashi Suzuki and
                  Tomoji Nakamura and
                  Toshiaki Suzuki and
                  Takeshi Nokuo},
  title        = {Scenario for catastrophic failure in interconnect structures under
                  chip package interaction},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112751},
  doi          = {10.1109/IRPS.2015.7112751},
  timestamp    = {Sun, 25 Oct 2020 23:11:45 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/OmiyaKSKSNSNSN15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}