BibTeX record conf/irps/NguyenGRCRFG19

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@inproceedings{DBLP:conf/irps/NguyenGRCRFG19,
  author       = {A. P. Nguyen and
                  Xavier Garros and
                  M. Rafik and
                  Florian Cacho and
                  David Roy and
                  Xavier Federspiel and
                  Fred Gaillard},
  title        = {Impact of Passive {\&} Active Load Gate Impedance on Breakdown
                  Hardness in 28nm {FDSOI} Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720591},
  doi          = {10.1109/IRPS.2019.8720591},
  timestamp    = {Thu, 04 Aug 2022 11:14:25 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/NguyenGRCRFG19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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