BibTeX record conf/irps/NaritaKISMYKTKKUKSNIWKO23

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@inproceedings{DBLP:conf/irps/NaritaKISMYKTKKUKSNIWKO23,
  author       = {Tetsuo Narita and
                  Daigo Kikuta and
                  Kenji Ito and
                  Tomoyuki Shoji and
                  Tomohiko Mori and
                  Satoshi Yamaguchi and
                  Yasuji Kimoto and
                  Kazuyoshi Tomita and
                  Masakazu Kanechika and
                  Takeshi Kondo and
                  Tsutomu Uesugi and
                  Jun Kojima and
                  Jun Suda and
                  Yoshitaka Nagasato and
                  Satoshi Ikeda and
                  Hiroki Watanabe and
                  Masayoshi Kosaki and
                  Tohru Oka},
  title        = {Reliability issues of gate oxides and {\textdollar}p-n{\textdollar}
                  junctions for vertical GaN metal-oxide-semiconductor field-effect
                  transistors (Invited)},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118047},
  doi          = {10.1109/IRPS48203.2023.10118047},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/NaritaKISMYKTKKUKSNIWKO23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}