BibTeX record conf/irps/MukhopadhyayCJSMGR23

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@inproceedings{DBLP:conf/irps/MukhopadhyayCJSMGR23,
  author       = {S. Mukhopadhyay and
                  C. Chen and
                  M. Jamil and
                  Jihan Standfest and
                  Inanc Meric and
                  Balkaran Gill and
                  Stephen Ramey},
  title        = {A Unified Aging Model Framework Capturing Device to Circuit Degradation
                  for Advance Technology Nodes},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117914},
  doi          = {10.1109/IRPS48203.2023.10117914},
  timestamp    = {Wed, 27 Mar 2024 12:58:52 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/MukhopadhyayCJSMGR23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}