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BibTeX record conf/irps/MikiSMMKAO22
@inproceedings{DBLP:conf/irps/MikiSMMKAO22, author = {Hiroshi Miki and M. Sagawa and Y. Mori and T. Murata and K. Kinoshita and K. Asaka and T. Oda}, title = {Accurate screening of defective oxide on SiC using consecutive multiple threshold-voltage measurements}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas, TX, USA, March 27-31, 2022}, pages = {8}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/IRPS48227.2022.9764583}, doi = {10.1109/IRPS48227.2022.9764583}, timestamp = {Wed, 31 May 2023 20:36:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MikiSMMKAO22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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