BibTeX record conf/irps/MikiSMMKAO22

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@inproceedings{DBLP:conf/irps/MikiSMMKAO22,
  author       = {Hiroshi Miki and
                  M. Sagawa and
                  Y. Mori and
                  T. Murata and
                  K. Kinoshita and
                  K. Asaka and
                  T. Oda},
  title        = {Accurate screening of defective oxide on SiC using consecutive multiple
                  threshold-voltage measurements},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {8},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764583},
  doi          = {10.1109/IRPS48227.2022.9764583},
  timestamp    = {Wed, 31 May 2023 20:36:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/MikiSMMKAO22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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