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BibTeX record conf/irps/MelaiSP23
@inproceedings{DBLP:conf/irps/MelaiSP23, author = {Joost Melai and V. Subramanian and I. Pouwel}, title = {Impact of Process Variation on {MIM} Capacitor Lifetime}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey, CA, USA, March 26-30, 2023}, pages = {1--4}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/IRPS48203.2023.10118006}, doi = {10.1109/IRPS48203.2023.10118006}, timestamp = {Wed, 24 May 2023 09:43:44 +0200}, biburl = {https://dblp.org/rec/conf/irps/MelaiSP23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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