BibTeX record conf/irps/McDonaldB21

download as .bib file

@inproceedings{DBLP:conf/irps/McDonaldB21,
  author       = {Tim McDonald and
                  Stephanie Watts Butler},
  title        = {Progress and Current Topics of {JEDEC} {JC-70.1} Power GaN Device
                  Quality and Reliability Standards Activity: Or: What is the Avalanche
                  capability of your GaN Transistor?},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405225},
  doi          = {10.1109/IRPS46558.2021.9405225},
  timestamp    = {Wed, 05 May 2021 14:20:15 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/McDonaldB21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.