BibTeX record conf/irps/LocatiMRRNC20

download as .bib file

@inproceedings{DBLP:conf/irps/LocatiMRRNC20,
  author       = {Jordan Locati and
                  Vincenzo Della Marca and
                  Christian Rivero and
                  Arnaud R{\'{e}}gnier and
                  Stephan Niel and
                  Karine Couli{\'{e}}},
  title        = {{AC} stress reliability study of a new high voltage transistor for
                  logic memory circuits},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128832},
  doi          = {10.1109/IRPS45951.2020.9128832},
  timestamp    = {Fri, 13 Aug 2021 20:28:36 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LocatiMRRNC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.