BibTeX record conf/irps/LoYCLWLCCLL20

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@inproceedings{DBLP:conf/irps/LoYCLWLCCLL20,
  author       = {Chieh Roger Lo and
                  Teng{-}Hao Yeh and
                  Wei{-}Chen Chen and
                  Hang{-}Ting Lue and
                  Keh{-}Chung Wang and
                  Chih{-}Yuan Lu and
                  Yao{-}Wen Chang and
                  Yung{-}Hsiang Chen and
                  Chu{-}Yung Liu},
  title        = {Study of the Walk-Out Effect of Junction Breakdown Instability of
                  the High-Voltage Depletion-Mode N-Channel {MOSFET} for {NAND} Flash
                  Peripheral Device and an Efficient Layout Solution},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129216},
  doi          = {10.1109/IRPS45951.2020.9129216},
  timestamp    = {Thu, 14 Oct 2021 10:37:09 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LoYCLWLCCLL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}