BibTeX record conf/irps/LiuZYXSKBWA20

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@inproceedings{DBLP:conf/irps/LiuZYXSKBWA20,
  author       = {Tianshi Liu and
                  Shengnan Zhu and
                  Susanna Yu and
                  Diang Xing and
                  Arash Salemi and
                  Minseok Kang and
                  Kristen Booth and
                  Marvin H. White and
                  Anant K. Agarwal},
  title        = {Gate Oxide Reliability Studies of Commercial 1.2 kV 4H-SiC Power MOSFETs},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129486},
  doi          = {10.1109/IRPS45951.2020.9129486},
  timestamp    = {Sat, 30 Sep 2023 09:49:38 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LiuZYXSKBWA20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}