BibTeX record conf/irps/LiuRWZJLWH22

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@inproceedings{DBLP:conf/irps/LiuRWZJLWH22,
  author       = {Yong Liu and
                  Pengpeng Ren and
                  Da Wang and
                  Longda Zhou and
                  Zhigang Ji and
                  Junhua Liu and
                  Runsheng Wang and
                  Ru Huang},
  title        = {New Insight into the Aging Induced Retention Time Degraded of Advanced
                  {DRAM} Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764508},
  doi          = {10.1109/IRPS48227.2022.9764508},
  timestamp    = {Mon, 03 Jun 2024 16:30:04 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LiuRWZJLWH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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