BibTeX record conf/irps/LiuLNMBGPKPM22

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@inproceedings{DBLP:conf/irps/LiuLNMBGPKPM22,
  author       = {Shou{-}En Liu and
                  Jian Li and
                  Deepak Nayak and
                  Amit Marathe and
                  Kaushik Balamukundhan and
                  Vishal Gosavi and
                  Ajaykumar Prajapati and
                  Baha Kilic and
                  Mengzhi Pang and
                  Arpit Mittal},
  title        = {Reliability Qualification Challenges of SOCs in Advanced {CMOS} Process
                  Nodes (Invited)},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {8},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764426},
  doi          = {10.1109/IRPS48227.2022.9764426},
  timestamp    = {Mon, 09 May 2022 18:11:24 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LiuLNMBGPKPM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}