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BibTeX record conf/irps/LiuLJWTLCL18
@inproceedings{DBLP:conf/irps/LiuLJWTLCL18, author = {Y. H. Liu and H. Y. Lin and C. M. Jiang and Tahui Wang and W. J. Tsai and T. C. Lu and K. C. Chen and Chih{-}Yuan Lu}, title = {Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353632}, doi = {10.1109/IRPS.2018.8353632}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/LiuLJWTLCL18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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