BibTeX record conf/irps/LiuHCJLFL19

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@inproceedings{DBLP:conf/irps/LiuHCJLFL19,
  author       = {S. E. Liu and
                  M. H. Hsieh and
                  Y. R. Chen and
                  J. Y. Jao and
                  M. Z. Lin and
                  Y. H. Fang and
                  M. J. Lin},
  title        = {High Voltage Tolerant Design with Advanced Process for {TV} Application},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720421},
  doi          = {10.1109/IRPS.2019.8720421},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LiuHCJLFL19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}