BibTeX record conf/irps/LiuCCYKFTLFL18

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@inproceedings{DBLP:conf/irps/LiuCCYKFTLFL18,
  author       = {S. E. Liu and
                  G. Y. Chen and
                  M. K. Chen and
                  David Yen and
                  W. A. Kuo and
                  C. S. Fu and
                  Y. S. Tsai and
                  M. Z. Lin and
                  Y. H. Fang and
                  M. J. Lin},
  title        = {Fast chip aging prediction by product-like {VMIN} drift characterization
                  on test structures},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353569},
  doi          = {10.1109/IRPS.2018.8353569},
  timestamp    = {Wed, 19 Jan 2022 12:00:25 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/LiuCCYKFTLFL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}