BibTeX record conf/irps/LiWDHDL18

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@inproceedings{DBLP:conf/irps/LiWDHDL18,
  author       = {Yun Li and
                  K. L. Wang and
                  Shaoyan Di and
                  Peng Huang and
                  Gang Du and
                  Xiao{-}Yan Liu},
  title        = {{PBTI} evaluation of In0.65Ga0.35As/In0.53Ga0.47As nanowire FETs with
                  Al2O3 and LaAlO3 gate dielectrics},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {7--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353702},
  doi          = {10.1109/IRPS.2018.8353702},
  timestamp    = {Tue, 08 Nov 2022 21:54:49 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/LiWDHDL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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