BibTeX record conf/irps/LiSHPBBC18

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@inproceedings{DBLP:conf/irps/LiSHPBBC18,
  author       = {Yunlong Li and
                  Michele Stucchi and
                  Stefaan Van Huylenbroeck and
                  Geert Van der Plas and
                  Gerald Beyer and
                  Eric Beyne and
                  Kristof Croes},
  title        = {{TSV} process-induced {MOS} reliability degradation},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353610},
  doi          = {10.1109/IRPS.2018.8353610},
  timestamp    = {Thu, 14 Oct 2021 10:37:09 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LiSHPBBC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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