BibTeX record conf/irps/LeiLKLYOG19

• > Home > conf/irps/LeiLKLYOG19

@inproceedings{DBLP:conf/irps/LeiLKLYOG19,
  author       = {Chenran Lei and
                  Albert Lee and
                  Qinkan Kang and
                  MinKwang Lee and
                  Seiji Yang and
                  Dan Oliver and
                  Tu Giao},
  title        = {Use of High Voltage {OBIRCH} Fault Isolation Technique in Failure
                  Analysis of High Voltage IC's},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720487},
  doi          = {10.1109/IRPS.2019.8720487},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LeiLKLYOG19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}