BibTeX record conf/irps/LeeLKKLLHKP22

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@inproceedings{DBLP:conf/irps/LeeLKKLLHKP22,
  author       = {Nam{-}Hyun Lee and
                  Sunhang Lee and
                  S.{-}H. Kim and
                  G.{-}J. Kim and
                  K. W. Lee and
                  Y. S. Lee and
                  Y. C. Hwang and
                  H. S. Kim and
                  S. Pae},
  title        = {Transistor Reliability Characterization for Advanced {DRAM} with {HK+MG}
                  {\&} {EUV} process technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764439},
  doi          = {10.1109/IRPS48227.2022.9764439},
  timestamp    = {Mon, 03 Jun 2024 20:36:56 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LeeLKKLLHKP22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}