BibTeX record conf/irps/LeeKKGEOGFVDW22

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@inproceedings{DBLP:conf/irps/LeeKKGEOGFVDW22,
  author       = {Kookjin Lee and
                  Ben Kaczer and
                  Anastasiia Kruv and
                  Mario Gonzalez and
                  Geert Eneman and
                  Oguzhan O. Okudur and
                  Alexander Grill and
                  Jacopo Franco and
                  Andrea Vici and
                  Robin Degraeve and
                  Ingrid De Wolf},
  title        = {Significant Enhancement of {HCD} and {TDDB} in {CMOS} FETs by Mechanical
                  Stress},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {10},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764540},
  doi          = {10.1109/IRPS48227.2022.9764540},
  timestamp    = {Mon, 09 May 2022 18:11:25 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LeeKKGEOGFVDW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}