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BibTeX record conf/irps/LeeJLA22
@inproceedings{DBLP:conf/irps/LeeJLA22, author = {Ethan S. Lee and Jungwoo Joh and Dong{-}Seup Lee and Jes{\'{u}}s A. del Alamo}, title = {Impact of Gate Offset on {PBTI} of p-GaN Gate HEMTs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas, TX, USA, March 27-31, 2022}, pages = {21--1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/IRPS48227.2022.9764442}, doi = {10.1109/IRPS48227.2022.9764442}, timestamp = {Mon, 09 May 2022 18:11:24 +0200}, biburl = {https://dblp.org/rec/conf/irps/LeeJLA22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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