BibTeX record conf/irps/LeeHHCJLWLLHC22

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@inproceedings{DBLP:conf/irps/LeeHHCJLWLLHC22,
  author       = {Jian{-}Hsing Lee and
                  Yeh{-}Jen Huang and
                  Li{-}Yang Hong and
                  Li{-}Fan Chen and
                  Yeh{-}Ning Jou and
                  Shin{-}Cheng Lin and
                  Walter Wohlmuth and
                  Chih{-}Cherng Liao and
                  Ching{-}Ho Li and
                  Shoa{-}Chang Huang and
                  Ke{-}Horng Chen},
  title        = {Incorporation of a Simple {ESD} Circuit in a 650V E-Mode GaN {HEMT}
                  for All-Terminal {ESD} Protection},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764596},
  doi          = {10.1109/IRPS48227.2022.9764596},
  timestamp    = {Wed, 07 Dec 2022 23:06:42 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/LeeHHCJLWLLHC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}