BibTeX record conf/irps/LandmanBSH22

download as .bib file

@inproceedings{DBLP:conf/irps/LandmanBSH22,
  author       = {Evelyn Landman and
                  Alex Burlak and
                  C. Nir Sever and
                  Marc Hutner},
  title        = {Applying Universal Chip Telemetry to Detect Latent Defects and Aging
                  in Advanced Electronics},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {38--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764449},
  doi          = {10.1109/IRPS48227.2022.9764449},
  timestamp    = {Mon, 09 May 2022 18:11:25 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LandmanBSH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.