BibTeX record conf/irps/KumarSTSM21

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@inproceedings{DBLP:conf/irps/KumarSTSM21,
  author       = {Satyam Kumar and
                  Tarun Samadder and
                  Karansingh Thakor and
                  Uma Sharma and
                  Souvik Mahapatra},
  title        = {Stochastic and Deterministic Modeling Frameworks for Time Kinetics
                  of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405155},
  doi          = {10.1109/IRPS46558.2021.9405155},
  timestamp    = {Mon, 21 Mar 2022 07:44:41 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/KumarSTSM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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