BibTeX record conf/irps/KranthiMMVS18

download as .bib file

@inproceedings{DBLP:conf/irps/KranthiMMVS18,
  author       = {Nagothu Karmel Kranthi and
                  Abhishek Mishra and
                  Adil Meersha and
                  Harsha B. Variar and
                  Mayank Shrivastava},
  title        = {Defect-Assisted Safe Operating Area Limits and High Current Failure
                  in Graphene FETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353571},
  doi          = {10.1109/IRPS.2018.8353571},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KranthiMMVS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.