BibTeX record conf/irps/KranthiKSBS20

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@inproceedings{DBLP:conf/irps/KranthiKSBS20,
  author       = {Nagothu Karmel Kranthi and
                  Boeila Sampath Kumar and
                  Akram A. Salman and
                  Gianluca Boselli and
                  Mayank Shrivastava},
  title        = {Design Insights to Address Low Current {ESD} Failure and Power Scalability
                  Issues in High Voltage {LDMOS-SCR} Devices},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129624},
  doi          = {10.1109/IRPS45951.2020.9129624},
  timestamp    = {Sat, 30 Sep 2023 09:49:38 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KranthiKSBS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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