BibTeX record conf/irps/Kerber15

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@inproceedings{DBLP:conf/irps/Kerber15,
  author       = {A. Kerber},
  title        = {Impact of {RTN} on stochastic {BTI} degradation in scaled metal gate/high-k
                  {CMOS} technologies},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112704},
  doi          = {10.1109/IRPS.2015.7112704},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/Kerber15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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