BibTeX record conf/irps/KendrickCGMSHSW18

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@inproceedings{DBLP:conf/irps/KendrickCGMSHSW18,
  author       = {Chris Kendrick and
                  Michael Cook and
                  Jeff P. Gambino and
                  T. Myers and
                  J. Slezak and
                  T. Hirano and
                  T. Sano and
                  Y. Watanabe and
                  K. Ozeki},
  title        = {Polysilicon resistor stability under voltage stress for safe-operating
                  area characterization},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353686},
  doi          = {10.1109/IRPS.2018.8353686},
  timestamp    = {Thu, 20 Oct 2022 15:32:36 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KendrickCGMSHSW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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