BibTeX record conf/irps/KempfMBMRNRPM18

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@inproceedings{DBLP:conf/irps/KempfMBMRNRPM18,
  author       = {Thibault Kempf and
                  Vincenzo Della Marca and
                  L. Baron and
                  F. Maugain and
                  Francesco La Rosa and
                  Stephan Niel and
                  Arnaud R{\'{e}}gnier and
                  Jean{-}Michel Portal and
                  Pascal Masson},
  title        = {Threshold voltage bitmap analysis methodology: Application to a 512kB
                  40nm Flash memory test chip},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353642},
  doi          = {10.1109/IRPS.2018.8353642},
  timestamp    = {Mon, 19 Jun 2023 16:27:29 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KempfMBMRNRPM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}