BibTeX record conf/irps/KasimLPPGIWWH23

• > Home > conf/irps/KasimLPPGIWWH23

@inproceedings{DBLP:conf/irps/KasimLPPGIWWH23,
  author       = {Rahim Kasim and
                  Cheyun Lin and
                  Christopher Perini and
                  James Palmer and
                  N. Gilda and
                  S. Imam and
                  Justin R. Weber and
                  C. Wallace and
                  Jeffery Hicks},
  title        = {Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in
                  Advanced process nodes},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117619},
  doi          = {10.1109/IRPS48203.2023.10117619},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KasimLPPGIWWH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}