BibTeX record conf/irps/JuA19

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@inproceedings{DBLP:conf/irps/JuA19,
  author       = {Xin Ju and
                  Diing Shenp Ang},
  title        = {Response of Switching Hole Traps in the Small-Area {P-MOSFET} Under
                  Channel Hot-Hole Effect},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720476},
  doi          = {10.1109/IRPS.2019.8720476},
  timestamp    = {Sun, 02 Oct 2022 16:09:05 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/JuA19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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