Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record conf/irps/JiKKLNJSKHCSPCD18
@inproceedings{DBLP:conf/irps/JiKKLNJSKHCSPCD18, author = {Younggeun Ji and Jeonghoon Kim and Jungin Kim and Miji Lee and Jaeheon Noh and Taeyoung Jeong and Juhyeon Shin and Junho Kim and Young Heo and Ung Cho and Hyun{-}Chul Sagong and Junekyun Park and Yeonsik Choo and Gilhwan Do and Hoyoung Kang and Eunkyeong Choi and Dongyoon Sun and Changki Kang and Sangchul Shin and Sangwoo Pae}, title = {Reliability characterization of advanced {CMOS} image sensor {(CIS)} with 3D stack and in-pixel {DTI}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {3}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353570}, doi = {10.1109/IRPS.2018.8353570}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/irps/JiKKLNJSKHCSPCD18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.