BibTeX record conf/irps/IoannouTLBAWBJ18

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@inproceedings{DBLP:conf/irps/IoannouTLBAWBJ18,
  author       = {Dimitris P. Ioannou and
                  Y. Tan and
                  R. Logan and
                  K. Bandy and
                  R. Achanta and
                  P. C. Wang and
                  Dave Brochu and
                  M. Jaffe},
  title        = {Hot carrier effects on the {RF} performance degradation of nanoscale
                  {LNA} {SOI} nFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {2--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353697},
  doi          = {10.1109/IRPS.2018.8353697},
  timestamp    = {Fri, 16 Apr 2021 11:25:49 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/IoannouTLBAWBJ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}