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BibTeX record conf/irps/IoannouTLBAWBJ18
@inproceedings{DBLP:conf/irps/IoannouTLBAWBJ18, author = {Dimitris P. Ioannou and Y. Tan and R. Logan and K. Bandy and R. Achanta and P. C. Wang and Dave Brochu and M. Jaffe}, title = {Hot carrier effects on the {RF} performance degradation of nanoscale {LNA} {SOI} nFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {2--1}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353697}, doi = {10.1109/IRPS.2018.8353697}, timestamp = {Fri, 16 Apr 2021 11:25:49 +0200}, biburl = {https://dblp.org/rec/conf/irps/IoannouTLBAWBJ18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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